XRF Spectrometers use a non-destructive method of energy dispersive x-ray fluorescence to determine the percent elemental composition, from Sodium to Uranium , of a solid, liquid or powdered sample.
BH Series Handheld XRF Analyzer
BDX Series Benchtop XRF Analyzer
Sulfur in Oil Analyzer
Thin Film Thickness Measurement Systems are capable of highly precise measuring of coatings and thin films between 1nm to 1mm that are applied to the surface of materials to alter their properties.
B20 Desktop Thin Film Thickness Measurement System
B40 Microscopic Thin Film Thickness Measurement System
BHC Thin Film Thickness Measurement System for Hard Coatings
Atomic Force, Lateral Force, and Scanning Tunnel Microscopy Systems measure the surface of a sample for nanoscale research in applications including: material science, semiconductors, data storage devices, polymers, optics with measurement of nanoscale topography, nano-mechanical, nano-electrical, and nanoscale chemical mapping.